D05700 - SEMI D57 - Guide for Definition of Measurement Index Visual Contrast Threshold (VCT) for Mura in FPD Image Quality Inspection Revision:SEMI D57-0310 - Superseded Auto Transport Usage covers the

Auto Transport Usage covers the 125 mm wafer size

It is the intent of this Document to provide general guidelines for preparation of calibration gas mixtures in compliance with ISO 6142

Dry etch equipment

SEMI E168-1114 (complete rewrite)

CCD(電荷偶合元件)的儀器上，SEMI D31得到的公式，可用來偵測在平面顯示器中的缺陷和瑕疵。

D05700 - SEMI D57 - Guide for Definition of Measurement Index Visual Contrast Threshold (VCT) for Mura in FPD Image Quality Inspection Revision:SEMI D57-0310 - Superseded Auto Transport Usage covers theSpecific definitions and quantifications of Mura are not consistent for many FPD manufacturers. Though there are standards for quantification of Mura, they are only used for limited types of Mura and are not practical in real varied cases. Currently it is still difficult to implement instruments to replace human inspectors for Mura inspections of LCDs. Therefore, it is necessary to standardize the classification of Mura for LCD. This Standard focuses